The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 1982
Filed:
Jul. 18, 1979
Taro Iwamoto, Hitachi, JP;
Shimon Ando, Hitachi, JP;
Sho Kusumoto, Hitachi, JP;
Tsutomu Omae, Hitachi, JP;
Toshitaka Suzuki, Hitachi, JP;
Masatake Takidera, Mito, JP;
Takaichi Koyama, Hitachi, JP;
Kunio Hamada, Mito, JP;
Kazuhiro Yoshida, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In a method and a system for inspection of the inside of a nuclear reactor vessel in which an inspection device for inspecting a defect in a nuclear reactor vessel is so moved by a drive/control device as to permit inspection of a part to be inspected in the reactor vessel, and the presence or absence of defect in the reactor vessel is judged based upon information from the inspection device in the course of the above-mentioned movement of the inspection device; the movement of the inspection device is pursued and monitored by monitor means, and the movement of the inspection device is suppressed when an abnormality in the movement of the inspection device is judged based upon information from the monitor means, to avoid the abnormal movement.