The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 1982
Filed:
Nov. 13, 1979
Arwed Brunsch, Stuttgart, DE;
Wolf D Ruh, Sommerhofenstr, DE;
Jochen Schneider, Gaertringen-Rohrau, DE;
Gerhard Trippel, Sindelfingen, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Direct method for measuring the magnetostriction constant .lambda..sub.s of soft magnetic and isotropic magnetic materials. A thin film sample is cantilevered and clamped at one edge. Under the influence of a magnetic AC field and the magnetostriction effect of the sample material, the free end of the cantilevered sample is deflected and oscillates with twice the frequency of the AC field. The resonance amplitude a.sub.res is measured by using a laser beam impinging upon the oscillating sample and measuring the reflected beam amplitude by means of a position-sensitive photodiode. The AC output signal of the photodiode is proportional to the sample amplitude. The magnetostriction constant .lambda..sub.s is directly proportional to the resonance amplitude a.sub.res multiplied by a constant factor which depends on known geometry and properties of the sample material.