The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 1982
Filed:
Jan. 28, 1980
Joel M Harris, Salt Lake City, UT (US);
Norman J Dovichi, Salt Lake City, UT (US);
University of Utah, Salt Lake City, UT (US);
Abstract
A technique for detecting very small quantities of particular materials by absorption of visible, ultraviolet or infrared light from a laser source is disclosed. The technique takes advantage of the thermal lens effect, i.e., a thermally induced alteration of the index of refraction, which occurs whenever a laser beam is passed through an absorbing medium, especially fluids. A converging beam derived from a coherent, collimated beam, e.g., a laser beam in the infrared, visible, or ultraviolet light range, is passed through a reference cell. The converging beam is slightly modified by a change in the index of refraction due to the thermal lens effect occurring within the reference cell. The modified beam is passed through a sample cell containing the identical medium as that in said reference cell with an additional material therein sought to be identified. The reference cell and sample cell are located at points in the beam path such that any modification in the beam caused by a change in the index of refraction of the medium in the reference cell is cancelled by the same medium in the sample cell. Any detectable modification in the beam, e.g., expansion (or divergence), as it evolves from the sample cell is due to the thermal lens effect caused by the material sought to be identified.