The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 1982
Filed:
Feb. 01, 1980
Erwin Sick, Icking, DE;
Klaus Ostertag, Munich, DE;
Erwin Sick GmbH, Waldkirch, DE;
Abstract
Apparatus for monitoring for faults in translucent strip material, such as photographic film, comprises a transport device 16, 12, 13, 22 for continuously moving the film 11 in its longitudinal direction and an optical scanning device 23 including a beam divider 21 which divides a single series of scanned light beams 14 into first and second sets of scanned light beams 14a 14b. The first set of light beams 14a is used to carry out transmission measurements on the film as it passes in tensioned condition between two spaced apart rollers 12, 13 and the second set 14b is used to carry out measurements in reflection as the film passes around the surface of a roller 16. The roller 16 has an air permeable surface and air is blown through this surface from the inside of the roller to form an air cushion between the film and the roller. Faults are detected by the electronic processing circuitry 18 in response to variations in the transmission and reflection measurements carried out by the light detectors 15 and 17.