The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 05, 1982

Filed:

Jul. 24, 1979
Applicant:
Inventors:

Toshihumi Yoshikawa, Nara, JP;

Zempei Tani, Tondabayashi, JP;

Akira Aso, Nara, JP;

Hitoshi Kawanabe, Yamatokoriyama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01J / ; H01L / ;
U.S. Cl.
CPC ...
250226 ; 2502 / ; 356222 ; 356223 ; 356402 ; 357 30 ;
Abstract

Disclosed is a solid state wavelength detection system responding to output signals derived from a photoelectric semiconductor device. The photoelectric semiconductor device comprise at least two PN junctions formed at different depth from the surface of the semiconductor substrate. A deeper PN junction develops an output signal related to longer wavelength component of the light impinging thereon. A shallower PN junction develops an output signal related to shorter wavelength component of the impinging light. These two output signals are logarithmically compressed and compared with each other. Difference of the logarithmically compressed output signals represents the wavelength information of the impinging light.


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