The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 1982
Filed:
Jan. 18, 1980
Viktor Bodlaj, Munich, DE;
Siemens Aktiengesellschaft, Berlin & Munich, DE;
Abstract
A device is disclosed for contact-free thickness or interval measurement wherein a light source generates a light ray beam which is periodically deflected. A beam divider divides out a light ray beam for reception by first and second light-sensitive detectors which receive light only along a specific optical axis. At least one third light-sensitive detector is provided whose optical axis intersects the light ray beam at a reference plane. Electronic evaluation means are provided for generating from signals of the first, second, and third detectors a control voltage corresponding to a deflection time of the light ray beam and also at least one voltage impulse which is a measure of an interval of a surface of a measured object from the reference plane. A reference voltage is provided and means are provided for generating a corrected reference voltage by changing the reference voltage in a direction opposite to a deviation of the control voltage from a normal operating voltage. An impulse/digital converter receives the voltage impulse and provides a digital output which is connected to a digital/analog converter which creates an analog output based upon the corrected reference voltage and the digital input.