The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 1982
Filed:
Jul. 16, 1979
Applicant:
Inventors:
Herbert Hahn, Loehnberg, DE;
Hans-Dieter Jacoby, Asslar-Werdorf, DE;
Richard Jung, Solms-Albshausen, DE;
Erich Schuster, Huettenberg, DE;
Assignee:
Ernst Leitz Wetzlar GmbH, Wetzlar, DE;
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33166 ; 3317 / ;
Abstract
Disclosed is a linear micrometer which comprises a cylindrically shaped housing, a tube-shaped sleeve displaceably mounted along the longitudinal axis of the housing and extending from one end of the housing, a measurement scale fixedly mounted along the longitudinal axis of the housing and slidingly supported inside the spindle sleeve, and a measurement readout means couple to the spindle sleeve for reading and displaying the relative position of the spindle sleeve to the scale. A rapid adjusting means and fine adjusting means are also provided.