The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 1981

Filed:

Nov. 09, 1979
Applicant:
Inventors:

Shinji Wada, Tokyo, JP;

Ikuo Kitao, Tokyo, JP;

Yasuo Kato, Tokyo, JP;

Taketoshi Ishihara, Tokyo, JP;

Yuji Sugahara, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351 13 ; 351 14 ;
Abstract

Eye refractmeter using infrared rays in which the target projecting optical system includes an aperture disc having a semicircular apertures disposed within a circle corresponding to the pupil of the patient's eye with chord portions thereof opposed to each other with a spacing therebetween. The observing optical system includes a disc having a slot located at a position corresponding to the space between the apertures. The apertures and the slots are located in conjugate with the patient's pupil with respect to the objective lens.


Find Patent Forward Citations

Wada, Shinji. (1981). Eye refractmeters using infrared rays (U.S. Patent No. 4306778). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4306778

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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