The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 22, 1981

Filed:

Dec. 13, 1979
Applicant:
Inventors:

Yutaka Sakurai, Katsuta, JP;

Takeo Nagata, Hitachi, JP;

Yoshitaka Matsuoka, Mito, JP;

Satoshi Shimada, Hitachi, JP;

Mitsuo Ai, Katsuta, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L / ;
U.S. Cl.
CPC ...
73721 ; 73720 ;
Abstract

A differential pressure transducer having a cantilever and a semiconductor strain gauge attached to each side of the cantilever at an intermediate portion of the latter. The cantilever has one end fixed by electron beam welding to a fixing member and the other end left for free displacement in response to a differential pressure. The displacement of the other end of the cantilever is detected as changes in the electric resistances of the semiconductor strain gauges.


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