The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 1981
Filed:
Jun. 24, 1980
Mohamed H Enein, Woking, GB;
Plessey Handel und Investments AG, Zug, CH;
Abstract
A system of operation for a scanning beam microwave landing system having aerial means for scanning a narrow microwave beam TO and FRO through a scanned angular sector and for transmitting signals with relatively wider beam patterns to cover sectors to the left and to the right of the scanned sector comprises, energizing the aerial means before the TO scan begins to produce the said relatively wider beam pattern on the left of the scanned sector at a time corresponding to a predetermined negative angle of scan with reference to the center line of the scanned sector which is outside the angular limit of the scanned sector, energizing the aerial means after the TO scan finishes to produce the said wider beam pattern on the right of the scanned sector at a time corresponding to the said predetermined angle of scan but positive with respect to the center line through the scanned sector which is outside the angular limit of the scanned sector, energizing the aerial means before the FRO scan begins to produce the said wider beam pattern again on the right of the scanned sector and at a time corresponding to the said positive predetermined angle as applied to the scan which is outside the angular limit of the scanned sector and energizing the aerial means after the FRO scan has finished to produce the said wider beam pattern on the left of the scanned sector at a time corresponding to the said negative predetermined angle of the scan which is outside the angular limit of the scanned sector, wherein the aerial means comprises one aerial array which is adapted to transmit the said wider beam pattern at different angles.