The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 15, 1981

Filed:

Jun. 30, 1980
Applicant:
Inventors:

Hajime Mikasa, Kyoto, JP;

Katsuya Tsuji, Kyoto, JP;

Hirofumi Ono, Kyoto, JP;

Assignee:

Horiba, Ltd., Kyota, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
422 62 ; 422 69 ; 422 89 ; 73 19 ; 73 231 ; 2323 / ;
Abstract

An apparatus for analyzing oxygen, nitrogen and hydrogen which are contained in metals. The apparatus includes a graphite crucible which has a sample therein and which is heated to generate a gaseous mixture of CO, N.sub.2 and H.sub.2. An oxidizer is used to oxidize the CO and H.sub.2 into CO.sub.2 and H.sub.2 O, respectively. The apparatus further includes a thermal conductivity detecting means for detecting CO.sub.2, N.sub.2 and H.sub.2 O, coming from a first gas-chromatographic column which is used for separating H.sub.2 O from the CO.sub.2 and N.sub.2. A second gas-chromatographic column is used for separating CO.sub.2 from N.sub.2. A passage change valve is used for back-flushing the first column. Helium is preferably used as the carrier gas. The apparatus is simple and operates quickly because the three components, O, N and H, can be measured by using a single carrier gas He and a single sample and thus, only a single measurement operation is required.


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