The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 1981
Filed:
Jan. 10, 1980
Applicant:
Inventors:
Carmine F Vasile, Huntington, NY (US);
Robert B Thompson, Thousand Oaks, CA (US);
Assignee:
Rockwell International Corporation, El Segundo, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73579 ; 73602 ;
Abstract
Disclosed is a method for determining the thickness of an object, including the steps of generating a higher order mode ultrasonic wave at a first location on the object, varying the frequency of the generated wave, and measuring, at a second location on the object, the minimum frequency at which the generated wave will propagate in the object. Where the ultrasonic wave generated is a horizontally polarized shear wave, the thickness t may be calculated from the relationship