The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 1981
Filed:
Sep. 06, 1979
Paavo Huttunen, Oulu, FI;
Matti Otala, Oulu, FI;
Jarmo Karvonen, Oulu, FI;
Martti Karppinen, Oulu, FI;
Esko Sohlo, Espoo, FI;
Oy Kolster AB, Helsingfors, FI;
Abstract
A method and an apparatus for measuring the wall thickness of a plastic article, particularly of a hollow rotation-symmetrical plastic article. According to the method, the wall of the plastic article is subjected to infra-red radiation and the intensity of, e.g., the continuously transmitted radiation is measured at preselected points, said intensity being a function of the wall thickness to be measured. At the same time, on one hand, the plastic article and, on the other hand, a radiation source and/or a radiation detector are set in an axial and rotational movement in relation to each other.