The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 1981

Filed:

Mar. 16, 1978
Applicant:
Inventors:

Jean-Pierre Huignard, Paris, FR;

Jean-Pierre Herriau, Paris, FR;

Jean-Louis Bruneel, Paris, FR;

Assignee:

Thomson-CSF, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
350-363 ; 356347 ; 365125 ; 430-1 ;
Abstract

The arrangement for displaying deformations of deformable structures by holographic interferometry, in which the interferogramme of the object is obtained by double exposure for an object subjected to periodic deformation or by prolonged exposure by comparison with the period of vibration for a vibrating object, comprises a recording electro-optical, photoconductive crystal to which is applied an electrical field substantially orthogonal to the mean direction of the fringes. The interferogramme is viewed in an image plane or recorded in a memory tube where it is desired to memorize the information because readout destroys the information. The arrangement can be made compact by integration of the displaying means in an enclosure. In that case, the source furnishes a reference beam and an object beam which are respectively directed towards the enclosure and the object by optic cables.


Find Patent Forward Citations

Huignard, Jean-Pierre. (1981). Arrangement for displaying deformations of deformable structures by (U.S. Patent No. 4304458). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4304458

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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