The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 1981

Filed:

Dec. 11, 1979
Applicant:
Inventor:

Kurt Ehrat, Steinmaur, CH;

Assignee:

Gretag Aktiengesellschaft, Regensdorf, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
250556 ; 356 71 ;
Abstract

Specimens, the quality of whose print is to be examined, are scanned photoelectrically point-by-point and compared point-by-point with one or more originals. The resulting reflectance differences are processed in different correction stages and then subjected to a point-by-point threshold decision, an individual threshold value being used for each image point. The threshold values are produced by analysis of specimens which have acceptable deviations, the maximum positive and negative reflectance differences due to their deviations being used directly as the threshold values. The analysis is effected by reference to electronically simulated specimens, an original or originals and a specimen being electronically displaced relatively to one another and reflectances being electronically varied in order to simulate register deviations and shade or tone deviations.


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