The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 1981

Filed:

Jul. 15, 1980
Applicant:
Inventor:

Vincent T Bly, Alexandria, VA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ; G01J / ;
U.S. Cl.
CPC ...
250332 ; 250342 ;
Abstract

A technique for optical non-uniformity correction of a focal plane imaging ystem wherein incoming objective scene light rays impinging on each detector in a focal plane array is corrected on a pixel-by-pixel basis by optical correction means from a separate optical source. The optical correction means is comprised of a multiplicative correction means and an additive correction means. The multiplicative correction means is comprised of a responsivity mask positioned on or near the focal plane that provides a multiplicative factor of unity or less to each detector to cause more uniform sensitivity of the detectors. The additive correction means is comprised of the separate optical source that is positioned in a separate optical train and is comprised of an additive optical correction mask aligned with a light source and focusing screen means and image relay that relay the additive optical correction sensitizing illumination onto the focal plane array or the pixel-by-pixel basis. The additive correction may be used alone.


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