The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 1981

Filed:

Jan. 09, 1981
Applicant:
Inventors:

Raymond F Jakubowicz, Rush, NY (US);

Paul N Schnipelsky, Rochester, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
422 63 ; 356244 ; 422 65 ;
Abstract

In an analyzer of the kind in which a reflectometer contacts a test element during scanning of the element, means are provided for moving test elements to and from the reflectometer in a manner avoiding significant contact wear of the reflectometer.


Find Patent Forward Citations

Jakubowicz, Raymond. (1981). Analyzer featuring a contacting reflectometer (U.S. Patent No. 4302420). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4302420

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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