The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 1981
Filed:
Jun. 13, 1980
Gunter Reinheimer, Biebertal, DE;
Herbert Leiter, Wetzlar, DE;
Ernst Leitz Wetzlar GmbH, Wetzlar, DE;
Abstract
An attachment camera for microscopes, comprising an apparatus for measuring the brightness of an object detail and markings for sighting at least the detail metering field and the image field of the camera in the observation beam. The metering field markings and the image field markings are located on two separate plates, the plate with the metering field marking is defined by a measuring field stop. The two markings differ in size and shape and are simultaneously reflected into the observation beam by means of a photographic ocular located in the picture taking beam and by means of optical components with partly or fully reflecting surfaces located before or after the photographic ocular. A holder (5a) seating in exchangeable manner the photographic ocular (5) is provided between the housing (24) of the attachment-camera and the binocular tube (25).