The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 1981
Filed:
Jan. 31, 1980
Applicant:
Inventors:
Robert B Thompson, Thousand Oaks, CA (US);
Carmine F Vasile, Huntington, NY (US);
Roger B Houston, Newbury Park, CA (US);
Assignee:
Rockwell International Corporation, El Segundo, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73602 ; 73643 ;
Abstract
Disclosed is a method for evaluating the structural integrity of an object, including the steps of generating a lowest order horizontal shear wave in the object, detecting the wave after it has propagated through the object, time gating the detected signal to reject nonuseful portions, Fourier transforming the time response of the detected signal into a frequency dependent response, and predicting the structural integrity of the object from the characteristics of the frequency response.