The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 1981
Filed:
Dec. 28, 1979
David L Favin, Little Silver, NJ (US);
Peter F Lynn, Little Silver, NJ (US);
Paul J Snyder, Linden, NJ (US);
Bell Telephone Laboratories, Incorporated, Murray Hill, NJ (US);
Abstract
Accurate and reliable measurement results are obtained in a test system (FIG. 1) employing digital data acquisition units (121) when measuring frequency response or envelope delay distortion of a network or communication facility (105) by employing a unique test signal (21-tone) including a plurality of tones, each tone having amplitude, frequency, phase component values determined and assigned in accordance with prescribed criteria. The phase component values are determined in accordance with a relationship dependent on the number of tones in the test signal, and in one example, are initially assigned on a random, one-to-one basis to the tones. In a specific embodiment, a test signal is utilized having 21 tones. Further problems arising from nonlinearities on the facility under evaluation (105) are minimized by transmitting the 21-tone test signal a plurality of times and by reassigning the phase component values to the tones each time the test signal is transmitted. In a specific example, the phase component values are reassigned to the tones in counterclockwise, circular fashion after each transmission of the test signal until each tone has taken on each phase component value. Once measurements, i.e., data records, of the transmitted test signal have been obtained, they are utilized to obtain a spectrum, and in turn, the frequency components of the spectrum are employed to obtain the desired measurement of frequency response or envelope delay distortion.