The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 1981
Filed:
Feb. 01, 1980
Maurice G Lemoine, Redwood City, CA (US);
Leonard A Pasdera, Redwood City, CA (US);
Ampex Corporation, Redwood City, CA (US);
Abstract
A method and apparatus is disclosed for controlling the sampling of a composite analog color video signal so that the analog signal is sampled at precise locations relative to the phase of the color subcarrier of the color video signal in the absence of modulation. The invention thereby enables a digitized signal having a constant phase relationship relative to the unmodulated subcarrier phase to be provided which can be advantageously used in magnetic recording and reproducing apparatus. Since the constancy of the location of the samples relative to the phase of the color burst is maintained prior to recording, there is no phase error that would pose a problem during reproducing of the signal. The apparatus stores a set of reference samples of a selected number of cycles of the color burst interval of the color video signal and generates an output clock signal that is phase synchronized with the reference samples, subsequently stores sets of comparison samples of color burst cycles from subsequent horizontal video lines using the generated clock signal and detects any error in the phase location thereof. The apparatus adjusts the phase of the generated output clock signal in response to any detected error signal and stores a new set of reference samples in the event that the error detected is beyond predetermined limits.