The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 1981

Filed:

Feb. 06, 1980
Applicant:
Inventor:

Anthony J Ley, Bievres, FR;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 364484 ;
Abstract

A waveform to be analyzed is repetitively sampled at corresponding instants in each of several cycles, and the samples from each cycle for a respective instant summed to derive an average value for that instant in one cycle of the waveform. The average values are then used for Fourier transform analysis, either by mathematical manipulation or by sequential correlation. The timing of the samples is determined by counting pulses from a high-frequency clock for one cycle of the waveform, truncating the count to remove the n least significant digits, and taking a sample every time a number of pulses equal to the truncated count has occurred (resulting in 2.sup.n samples per cycle for a modulo 2 counter).


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