The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 1981
Filed:
Feb. 21, 1980
Herbert Goebel, Munich, DE;
Siemens Aktiengesellschaft, Berlin & Munich, DE;
Abstract
An x-ray diffractometer is disclosed having a position-sensitive detector which is quasi-continuously movable in stepped fashion around a sample by a stepping motor. Output signals triggered by x-ray quanta are output from the position-sensitive detector and converted by an electronic evaluation unit into a time duration corresponding to a position of a particular x-ray quantum in the detector. The time-digital converter connected to the evaluation unit converts the time duration to a digital signal. A digital adder is provided having three inputs. The first input connects to an output of the time-digital converter, the second input connects to receive a digital value generated by a counter associated with the stepping motor, and a third input connects with a digital region selector. An output of the adder connects to a multi-channel analyzer having a plurality of regions therein for analyzing various desired measurement applications. The digital region selector addresses the appropriate region in the analyzer for a desired measurement application.