The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 1981
Filed:
May. 22, 1980
Donald R Demers, Nashua, NH (US);
Charley D Allemand, Newton, MA (US);
Baird Corporation, Bedford, MA (US);
Abstract
An inductively coupled plasma atomic fluorescence spectrometer (ICP-AFS) for multielement analysis of unknown samples. The ICP-AFS spectrometer comprises a plasma stream atomizing a dispersed sample and directed along a central axis, a plurality of optical stations surrounding the central axis, each including an energizing illuminator and a fluorescence detector focused at the same region of the plasma stream, and a readout system for identifying the unknown samples. Preferably, the plasma stream is controlled by inductive coupling, the energizing illuminator is a modified hollow cathode lamp, the fluorescence detector includes an interference filter, and the readout system incorporates multiplexing and intermittent modulation of the energizing illuminators.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile