The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 1981
Filed:
Jun. 15, 1979
Isao Ito, Nagoya, JP;
NGK Insulators, Ltd., Nagoya, JP;
Abstract
An apparatus for measuring contour configuration of articles, particularly brittle articles such as ceramic honeycombs without touching them comprising a turn table on which the article to be measured is placed, a rotary encoder mechanically coupled to the turn table for producing a rotational angle signal representing a rotational position of the article on the turn table, an edge detector including a parallel light projecting member and a parallel light receiving member, those members being arranged on respective sides of the turn table in such a manner that a part of the parallel light is shielded or cut by the article and an edge position signal is produced, a memory for storing a standard edge position signal which will be produced by the edge detector when a standard article having given dimensions placed on the turn table is scanned during a single rotation thereof, and an operation circuit for receiving the rotational angle signal from the rotary encoder, the edge position signal from the edge detector and the standard edge position signal from the memory and comparing these edge position signals under the control of the rotational angle signal to produce a deviation of contour configuration of the article from the standard article.