The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 1981
Filed:
Jun. 15, 1979
Isao Ito, Nagoya, JP;
Seiichi Tunashima, Kasugai, JP;
NGK Insulators, Ltd., Nagoya, JP;
Abstract
An apparatus for measuring contour configuration of articles, particularly brittle articles such as ceramic honeycombs without touching them comprising a turn table on which the article to be measured is placed, a rotary encoder mechanically coupled to the turn table for producing a rotational angle signal representing a rotational position of the article on the turn table, a lamp for illuminating the article on the table, particularly a portion of article to be measured such as an upper edge or side edge, a pick-up device including a lens for forming an optical image of said portion of article and an image detector such as a linear array of image sensor for converting the optical image into a picture signal, a memory for storing a standard picture signal which will be produced by the image detector when a standard article having given dimensions placed on the turn table is scanned during a single rotation thereof, and an operation circuit for receiving the rotational angle signal from the rotary encoder, the picture signal from the pick-up device and the standard picture signal from the memory and comparing these picture signals under the control of the rotational angle signal to produce a deviation of contour configuration of the portion of article from the standard article.