The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 1981
Filed:
Sep. 10, 1979
Emilio Milana, Rivalta, IT;
Franco Rasello, Gabiano, IT;
Centro Ricerche Fiat S.p.A., Orbassano, IT;
Abstract
Quality control inspection of the surface of a workpiece is effected by scanning a coherent monochromatic light beam over the workpiece surface. Photomultipliers are used to generate two electrical signals respectively indicative of the magnitude of the specular component of light reflected from the workpiece and of the component of light scattered in a predetermined direction off the workpiece. These two signals are combined in a manner which serves to eliminate noise due to surface roughness of the workpiece. The combined signal is compared with a threshold value to provide an indication of surface defects. The inspection apparatus can incorporate a laser for producing the light beam which can be conveniently scanned across the workpiece surface using an oscillating mirror.