The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 1981

Filed:

Mar. 05, 1980
Applicant:
Inventors:

John M Haslop, Woodley, GB;

Reginald G Knapman, Overton, GB;

Michael A West, London, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G01N / ; B42D / ; G06K / ;
U.S. Cl.
CPC ...
250372 ; 2504 / ; 283 / ; 356 71 ; 356 72 ;
Abstract

In a method of detecting sheets which do not have a genuine watermark (i.e. watermarks which result from variations in fibre distribution introduced during manufacture) the absorption of ultra-violet radiation is measured for each sheet in the area in which the watermark is expected to be present, and the transmittance of light by this area of the sheet is also measured. Sheets for which the absorption measurement does not show a substantially constant value, and sheets for which the light-transmittance shows a substantially constant value over the said area, are rejected. The absorption measurement is preferably effected by measuring the reflectance of ultra-violet radiation by the sheet, but the transmittance of ultra-violet radiation or the fluorescence of the sheet in the presence of ultra-violet radiation can also be measured. The measured value for the area can be compared with a reference value obtained by a measurement of the same parameter outside the watermark area.


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