The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 1981

Filed:

Oct. 10, 1979
Applicant:
Inventors:

Paul H Kreinbrink, Temperance, MI (US);

David C Neiman, Waterville, OH (US);

Assignee:

Libbey-Owens-Ford Company, Toledo, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06M / ;
U.S. Cl.
CPC ...
235 / ; 235 / ; 235 / ;
Abstract

An apparatus for serially counting the fragments of a fractured tempered glass article including a probe assembly for touching and producing an electrical signal each time a fragment is touched, the probe assembly also marking each touched fragment. The apparatus also includes a numerical counter electrically connected to the probe assembly for cumulatively adding the number of fragments touched in a given area of the article and displaying a running tally of the counted fragments.


Find Patent Forward Citations

Kreinbrink, Paul. (1981). Marking and counting probe assembly (U.S. Patent No. 4295038). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4295038

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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