The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 1981
Filed:
Jan. 28, 1980
Yukio Ohtake, Tokyo, JP;
Masahiro Nakamura, Tokyo, JP;
Ohtake Works Company, Ltd., Tokyo, JP;
Abstract
Rotary shaking culture measuring method and apparatus characterizes in that culture tubes are disposed radially and at equal intervals in the circumferential direction, and an inclined turntable is disposed at a predetermined angle of inclination with respect to a horizontal reference plane, a central shaft of the inclined turntable serves as a driving shaft whereby a turning motion in a continuous or intermittently indexing form is imparted to the turntable. In addition, the culture tubes revolve along an inclined circular orbit described by such turning motion, and the substance being cultured within the tubes is shaked and cultured by a reciprocative motion of inertial resultant force of centrifugal force and gravity. Furthermore, in a certain position of the turntable the growth of the substance being cultured within all the culture tubes is measured with the lapse of time by a signal obtained at every fixed cycle.