The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 1981
Filed:
Nov. 13, 1978
Shinzi Wada, Tokyo, JP;
Ikuo Kitao, Tokyo, JP;
Yoshinori Oana, Tokyo, JP;
Yasuo Kato, Tokyo, JP;
Taketoshi Ishihara, Tokyo, JP;
Tokyo Kogaku Kikai Kakushiki Kaisha, Tokyo, JP;
Abstract
An apparatus for detecting astigmatic axes and measuring refractive powers such as the lens of a human eye. A disc has a first group of slits oriented in one direction and a second group of slits oriented perpendicular thereto. Each slit has a deflecting means with a direction of deflection perpendicular to the lengthwise direction of its slits for measuring the refractive power. The apparatus also has astigmatic axis detecting target means which can be used immediately prior to the refraction so that the refraction on each astigmatic axis can be measured before conditions change in the eye.