The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 1981

Filed:

Sep. 21, 1978
Applicant:
Inventors:

Yoshimi Kohayakawa, Yokohama, JP;

Yasuyuki Ishikawa, Kawaguchi, JP;

Shigeo Maruyama, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351 13 ; 351 14 ;
Abstract

An eye refractometer is provided with a projection optical system for projecting test beams forming test patterns such that the central ray of each test beam passes through the pupil of the eye to be inspected while being spaced apart from the optic axis in order to form test patterns corresponding to three meridians forming 60.degree. with each, a focusing lens disposed in the projection optical system and movable only in one direction during one measurement, and a beam detecting device for detecting the reflected images of the test patterns by the retina of the eye and generating electrical signals corresponding to the three meridians.


Find Patent Forward Citations

Loading…