The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 1981

Filed:

Dec. 26, 1978
Applicant:
Inventor:

Christopher M Fortunko, Thousand Oaks, CA (US);

Assignee:

Rockwell International Corporation, El Segundo, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01R / ; G01N / ;
U.S. Cl.
CPC ...
324237 ; 324234 ; 331 65 ; 331 96 ; 3311 / ; 3311 / ;
Abstract

An apparatus for characterizing a surface anomaly in an electrically conductive sample includes an oscillator with an amplifier for supplying gain to the oscillator, a feedback loop linking the input and output of the amplifier, a two port ferromagnetic resonator connected within the loop to modulate the level and frequency of oscillation of the oscillator in response to eddy currents induced in the surface of the sample by the resonator, a variable attenuator connected within the loop to adjust the power level of the oscillator, and an adjustable phase shifter connected within the loop for changing the total phase shift of the loop. A sensing circuit is operably connected to the output of the amplifier to monitor the resonance parameters of the oscillator.


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