The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 1981
Filed:
Jan. 24, 1980
Cole H Baker, Westport, CT (US);
Intec Corporation, Trumbull, CT (US);
Abstract
The beta ray gauge is augmented with a radiation inspection system for automatically improving products formed into a continuous web such as non-woven paper, non-woven textiles, plastics, etc. For example, the basis weight of a continuous web of paper is measured by passing the web through a beta ray gauge which generates a first signal based on the weight of the paper web. The first signal generated by the beta ray gauge is compared with a predetermined preset reference signal representing the basis weight desired. After the beta ray gauge measures the basis weight in the paper making process, a light inspection system applies a light source across the paper web and detects the light emanating therefrom to provide a second signal based on the characteristics of the paper web. The light inspection system continuously generates the second signal across the entire width of the web, and accordingly rapidly inspects the entire web with greater spatial resolution than the beta gauge which is stationary or slow moving. The first and second signals are compared producing a control signal which is used to regulate the dispensing of the paper stock forming the continuous paper web or to otherwise monitor and grade the continuous web output.