The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 1981

Filed:

Feb. 27, 1979
Applicant:
Inventors:

Yoshiyasu Sakamoto, Amagasaki, JP;

Yoichi Tamura, Amagasaki, JP;

Kiyohiko Kawaguchi, Amagasaki, JP;

Kiyotaka Inada, Amagasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356335 ;
Abstract

A method and apparatus for determining the particle size distribution of particles in a mass of a granular substance. The particles are caused to fall in a stream of separate particles past an irradiated screen, and an instantaneous television picture is taken of the particles and the projected images of the particles are used to measure the projected areas of the particles. Using these areas assuming the average shape of the particles to be substantially a rotational ellipsoid and using a coefficient according to the average configuration of the particles, the particle sizes and their distribution in the mass of particles are calculated.


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