The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 1981
Filed:
Nov. 15, 1978
Applicant:
Inventors:
Bertram A Auld, Menlo Park, CA (US);
Gary W Elston, Santa Clara, CA (US);
Assignee:
Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324237 ; 324235 ; 324300 ;
Abstract
A probe and method for detecting surface flaws in metals. The probe operates at microwave frequencies and uses a ferromagnetic resonator. The resonator experiences a frequency shift when brought into proximity with a metal because of the perturbations of the demagnetizing fields at the boundaries of the resonator. A crack in the metal additionally disturbs the field and causes additional perturbations of the frequency. The perturbations in frequency are detected to provide an indication of flaws in the surface of the metal.