The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1981
Filed:
Feb. 21, 1978
Ira L Morgan, Austin, TX (US);
E C Sudarshan, Austin, TX (US);
Alvin L Mitchell, Austin, TX (US);
James P Coose, Austin, TX (US);
Hunter D Ellinger, Austin, TX (US);
James W Jagger, Austin, TX (US);
Other;
Abstract
Apparatus and method for the tomographic examination of planar sections of an object is disclosed which includes a plurality of sources spaced about an object at fixed intervals which emit a set of planar beams of penetrating radiation, such as X-rays or gamma rays, through a planar section of the object and a plurality of self-collimating detector arrays positioned to receive only photons of radiation which pass through the planar section of the object from the source directly opposite the array. The sources and detector arrays are mounted on a mounting apparatus to prevent movement relative to each other. Each of the detector arrays includes a plurality of self-collimating detectors which count the number of individual primary radiation photons passing through the object along the path from the source to the detector without absorption or deflection.