The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1981
Filed:
Mar. 02, 1979
Sho Kusumoto, Hitachi, JP;
Yoshio Fukuda, Hitachi, JP;
Sadao Nemoto, Hitachiota, JP;
Naoki Sakurama, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
There is provided polychromatic X-ray source used in a polychromatic X-ray diffraction apparatus, in which polychromatic X-rays are cast upon a sample to be analyzed, the energies of the X-rays diffracted from the crystallographic planes of the sample are measured and the physical properties of the sample are detected on the basis of the measured energies. The polychromatic X-ray source has a container made of radiation shielding material and having an X-ray outlet channel and the container contains therein a radionuclide for emitting radioactive rays and a substance for scattering and absorbing the radioactive rays emitted from the substance so as to obtain polychromatic X-rays. The polychromatic X-rays emitted from the substance travel through the X-ray outlet channel and are then made parallel through a Soller slit to be cast upon the sample. A slide door is provided in the channel so as to block the polychromatic X-rays if necessary.