The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1981
Filed:
Feb. 23, 1979
Mikio Takemae, Yokohama, JP;
Hiroaki Tanaka, Tokyo, JP;
Nippon Kogaku K.K., Tokyo, JP;
Abstract
An apparatus for measuring the distance between an extremum or object and the apparatus comprises a scanning system for scanning the entire distance range to be measured, the scanning system detecting objects at different distances from the apparatus within the range and producing in a time series an output which assumes an extremal value upon the detection, apparatus for producing a distance signal representing the scanned distance in a time series, a distance selecting device extraneously operable to select a desired distance range within the entire distance range to be measured, extremal value detecting apparatus for detecting the extremal value of the output of the scanning system corresponding to the selected distance range by the output of the distance selecting device, and apparatus for providing an output representing the distance between an object within the selected distance range and the apparatus from the output of the extremal value detecting apparatus and the distance signal.