The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 1981
Filed:
Jan. 07, 1980
Applicant:
Inventor:
Peter D Southgate, Princeton, NJ (US);
Assignee:
RCA Corporation, New York, NY (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
3401 / ; 250572 ; 3401 / ; 3501 / ; 356430 ; 358106 ;
Abstract
System for the analysis of an optically sensed field, useful, for example, for detecting defects in an object such as a shadow mask of a color kinescope, which permits relatively rapid examination of the article or surface being scanned. An important feature of the system is a detector linear array disposed a selected distance from the image plane of the spatial field permits higher speed sequential convolution of the spatial field at each of a plurality of overlapping segments of given length, situated at uniformly-spaced intervals along a field dimension, with a given type of limited spatial extent kernel function of said given length.