The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 1981
Filed:
Jul. 17, 1979
Applicant:
Inventor:
Patrick F Dunn, Downers Grove, IL (US);
Assignee:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 324 / ; 324446 ;
Abstract
The local void fraction in liquid containing a gas is measured by placing an impedance-variation probe in the liquid, applying a controlled voltage or current to the probe, and measuring the probe current or voltage. A circuit for applying the one electrical parameter and measuring the other includes a feedback amplifier that minimizes the effect of probe capacitance and a digitizer to provide a clean signal. Time integration of the signal provides a measure of the void fraction, and an oscilloscope display also shows bubble size and distribution.
Dunn, Patrick. (1981). Apparatus for measuring the local void fraction in a flowing liquid (U.S. Patent No. 4282481). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4282481
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