The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 1981

Filed:

Oct. 17, 1979
Applicant:
Inventors:

Gerald D Hunter, Lino Lakes, MN (US);

Gaston A Palombo, Agoura, CA (US);

Assignee:

Honeywell Inc., Minneapolis, MN (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
2502 / ;
Abstract

A chromosome detector using a scanning microscope system is used to detect the presence of a chromosome spread in a slide specimen and to produce a signal usable by the scanning microscope system to automatically operate the microscope system whereby the detected chromosomes are centered in the field of view, are automatically focused and their location converted to coordinate data which is stored in a memory system whereby the system may be used to re-examine the detected chromosome by the use of the stored X-Y coordinates. The detector performs an amplitude and frequency analysis of a cell find signal produced by a slide scanner in the scanning microscope system and produces, in turn, an output signal representative of a detected chromosome spread and compatible with the scanning microscope control circuit.


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