The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 1981

Filed:

Dec. 03, 1979
Applicant:
Inventors:

Ichiro Mitamura, Tokyo, JP;

Katsuo Isono, Kawagoe, JP;

Takashi Hosono, Yokohama, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358 67 ;
Abstract

Horizontal scanning rate correction apparatus is provided for beam index color cathode-ray tubes of the type having a screen, an electron gun for projecting an electron beam upon the screen, a plurality of index elements positioned to be struck by the electron beam as it scans across the screen, a deflection device for causing the electron beam to repeatedly scan across the screen in a vertical succession of horizontal lines, and an index signal processing circuit for producing an index signal having a frequency determined by the frequency of the incidence of the electron beam upon the index elements as it scans horizontal lines and for controlling color switching circuitry which determines which of a plurality of color signals modulates the intensity of the electron beam. The horizontal scanning rate correction apparatus includes a memory circuit for storing correction values derived from the index signal processing circuit during horizontal scanning by the electron beam and representing the deviation of the horizontal scanning rate from a desired scanning rate at each of a plurality of horizontal sampling positions along a horizontal line. The apparatus further includes circuitry for reading the correction values from the memory circuit and for producing a corresponding signal which is supplied to the electron beam deflection device to substantially cancel deviations in the horizontal scanning rate.


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