The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 1981

Filed:

Mar. 12, 1980
Applicant:
Inventor:

Adolf Mlot-Fijalkowski, Lincolnwood, IL (US);

Assignee:

Magnaflux Corporation, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05D / ; C09K / ;
U.S. Cl.
CPC ...
427157 ; 427-8 ; 427-9 ;
Abstract

A method for non-destructive testing for flaws on the surface of a workpiece which includes the step of applying a penetrant composition including a fluorescent dye in a liquid vehicle onto the surface to permit the penetrant to become trapped in the flaws and then removing excess penetrant from the surface while leaving penetrant entrapped in such flaws. A remover is then applied to the surface, the remover composition including a solvent, at least one surface active agent which serves as an emulsifier for the liquid vehicle of entrapped penetrant, and a fluorescent material which is more readily soluble in the liquid vehicle of the penetrant than it is in the solvent. Upon contact of the entrapped penetrant with the remover, the fluorescent material from the remover is preferentially absorbed in the penetrant vehicle entrapped in the flaws thereby enhancing the fluorescent indication provided by the entrapped penetrant. The indications are developed in the usual way by applying a developer to the surface to draw the entrapped penetrant to the surface of the workpiece where it is contrastingly visible to the surface and is observable by viewing the surface under ultraviolet light.


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