The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 1981

Filed:

Oct. 23, 1979
Applicant:
Inventors:

Tomihiro Fukada, Nagareyama, JP;

Mitsuru Kamei, Mito, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L / ;
U.S. Cl.
CPC ...
73708 ; 73706 ; 73719 ;
Abstract

A pressure measuring apparatus using process transmission media and comprising measuring and compensation systems. These systems have the substantially same construction which comprises a pressure receiving portion, a pressure transmitting portion and a pressure detecting portion. The pressure transmitting portion is divided into two sections, each of them contains a liquid NaK and a heat-resisting inert liquid, respectively, as pressure transmission media. A pressure of a fluid to be measured which is introduced into the pressure receiving portion of the measuring system is transmitted through the transmitting portion to the pressure detecting portion where the pressure is detected. A pressure of a gas introduced into the pressure receiving portion of the compensation system is detected in the pressure detecting portion of the compensation system in a same manner. The temperature compensation is conducted by subtracting a detected pressure in the compensation system from that in the measuring system.


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