The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 1981

Filed:

Jul. 12, 1978
Applicant:
Inventor:

Walter Guggenbuhl, Stafa, CH;

Assignee:

Contraves AG, Zurich, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
324 / ;
Abstract

A method of, and circuit for, producing measuring pulses in a particle analyzer for the analysis of particles suspended in a liquid, especially blood cells, comprising a conductivity or measuring cell, whose impedance between two terminals of the conductivity cell changes upon passage of a particle through such conductivity cell. A controllable current supply powers the conductivity cell with a current regulated to maintain a reference value corresponding to a control value. A receiver functioning as a high-pass filter and having high input impedance serves for the essentially currentless removal of a potential between the terminals of the conductivity cell and for forming a receiver signal corresponding to such components of such potential whose frequency is above a threshold or cut-off frequency corresponding to the high-pass filter. The control value is formed from the sum of a predetermined reference value and the received signal. There is formed a measuring signal proportional to the difference of the control value and the reference value and whose timewise changes correspond to the measuring pulses.


Find Patent Forward Citations

Guggenbuhl, Walter. (1981). Method and circuit for producing measuring pulses in a particle analyzer (U.S. Patent No. 4277743). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4277743

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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