The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 1981

Filed:

Jul. 26, 1979
Applicant:
Inventors:

David J Brown, North Baddesley, GB;

Ronald G Walther, Raleigh, NC (US);

Thomas W Williams, Longmont, CO (US);

Michael D Wrigglesworth, Pembroke Park, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K / ;
U.S. Cl.
CPC ...
3072 / ; 3072 / ; 307291 ;
Abstract

A shift register latch circuit (FIG. 1) comprised of a polarity hold latch 1 connected to a set/reset latch 2. The latches can be clocked with separate non-overlapping clock trains (+A, +B and +C) so that automatically generated test patterns can be applied to a scan input S to test the circuit. This conforms to the so-called Level Sensitive Scan Design (LSSD) rules. During system operation, the shift register latch circuit operates as a `D` type edge trigger by connecting the clock input +B of the set/reset latch 2 to the clock -C supplied to the polarity hold latch 1. By connecting a number of shift register latches together a Johnson counter can be formed and by clocking all latches with a single oscillator, a series of non-overlapping clock trains can be produced. Implementations of the shift register latch in AND circuits or AND OR INVERT circuits are described.


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