The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 1981
Filed:
Jan. 09, 1980
Claus Kleesattel, San Jose, CR;
Other;
Abstract
A method and apparatus are provided for measuring the magnitude of spherical hardness testing indentations in solid surfaces by scanning the indentations with a light beam. Scanning is achieved by tilting the beam in one or several planes perpendicular to the testpiece surface through a point which is the center of rotation for the beam tilting as well as the center of curvature of the indentation area in the plane of tilting. At least the part of the indenter making contact with the indented surface is spherically shaped, and the scanning light spot follows an arcuate path in the indentation being measured. The scanning light beam is sent through a transparent indenter, or scanning is carried out directly on the indentation after removal of the indenter. The intensity of the light reflected from the indentation in the direction of incidence is continuously measured, and the angle between the two principle intensity variations on each scan serves for determining the magnitude of the indentation and thus the Brinell hardness of the tested surface.