The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 1981
Filed:
Aug. 21, 1978
Shinzi Wada, Tokyo, JP;
Ikuo Kitao, Tokyo, JP;
Yasuo Kato, Tokyo, JP;
Taketoshi Ishihara, Tokyo, JP;
Tokyo Kogaku Kikai Kabushiki Kaisha, Tokyo, JP;
Abstract
An eye refractmeter comprising a target projecting optical system for projecting an image of a target means through a pupil of a patient's eye to produce a target image on a retina of the eye, an observing optical system including objective lens means for observing the target image through the pupil, and a sighting optical system for observing light reflected at the cornea of the eye to determine that the objective lens means is appropriately spaced from the patient's eye, means being provided in the projecting optical system so that the image of the target means is projected by an infrared ray, half-transparent optical means for passing therethrough one of the light bundles along the observing and sighting optical systems and reflecting the other of the bundles, means for directing both of the light bundles passing through the observing and sighting optical systems to a single image pick-up tube, the half-transparent optical means having a reflecting rate such that more than 50% of the light along the observing optical system and less than 50% of the light along the sighting optical system are directed to the image pick-up tube.