The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 1981
Filed:
May. 18, 1979
Arthur Vassiliadis, Mountain View, CA (US);
Rodenstock Instruments Corporation, Sunnyvale, CA (US);
Abstract
An automatic lensmeter (48) for determining the refractive properties of a test lens (76) including optics (52, 58, 62, 64, 68, 70, 72, 74) for producing a collimated, nonrotational beam of light, equally disposed about and propagating along an optical axis (50), which is refracted by the test lens (76), a nonrotational mask (18) having an annulus (24) for generating a stationary elliptical loop (28) of light at a detecting plane (26), the loop (28) having a shape, size and location dependent on the refractive properties of the test lens (76), and a photodetector (31) at the plane (26) to intercept the loop 28. The lensmeter (48) has no moving optical components and, due to the loop 28, provides an infinite number of points to determine very accurately one or more of the refractive properties, thereby overcoming problems with prior automatic lensmeters having relatively rotational optics and/or providing a finite number of points at a detecting plane.